1、通过偏振调制红外反射吸收光谱（PM-IRRAS）测量薄膜_Measurement of Thin Films by Polarization-Modulation Infrared Reflection-Absorption Spectroscopy (PM-IRRAS)
2、Thickness Analysis of Natural Oxide Films using a MSV-5000 Microscopic Spectrophotometer
3、Automated Semi-Conductor Wafer Analysis in the IR or NIR Region for Film-Thickness
工信部备案：辽ICP备16005993号-1
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